|
KMID : 0381920030330030187
|
|
Korean Journal of Microscopy
2003 Volume.33 No. 3 p.187 ~ p.193
|
|
|
A Simple Method to Determination the Rotation Angle Between an Image and its Diffraction Pattern with LACBED Patterns
|
|
Kim Hwang-Su
Kim Jong-Pil
|
|
|
Abstract
|
|
|
|
When electron microscope images and selected area diffraction patterns of crystalline materials are being compared, it is important to know for the rotation of the diffraction pattern with respect to the image caused by the magnetic lens in the Electron Microscope. A well-known method to determine this rotation is to use a test crystal of MoO3. But this method of determination of the rotation angle contains an uncertainty of 180℃. Thus one has to devise another way to eliminate this uncertainty. In this paper we present a new and simple method of determining this rotation without any complexity. The method involves a process of obtaining LACBED patterns of crystalline materials. For the J2010 electron microscope, the rotation is determined to be 180℃ and this angle remains unchanged for changing of the magnification and the camera length.
|
|
|
KEYWORD
|
|
|
Image rotation , J2010 , LACBED
|
|
|
FullTexts / Linksout information
|
|
|
|
|
Listed journal information
|
|
|